Silver Atena provides a six-channel carrier board for the accommodation of input and output modules (HIL/IN and HIL/OUT modules) in an AT-HIL test system.
The product has been developed for the modular setup of a test system and (in combination with the HIL back plane and a 19’’ 3HE rack) forms the basis of the Silver Atena AT-HIL modular system.
The carrier board offers space for six input and six output modules respectively. It forms a powerful real-time controllable system for high precision signal conditioning (e.g. for simulating various sensor signals), signal remeasuring and failure injection.
The sockets on the front panel (BOB: Breakout Box) allow manual test runs, for example signal failure, connecting external measuring or real components. In normal mode, the respective connector pairs are short-circuited.
The connection of all signals occurs via the back plane connector.
By connecting real components (e.g. sensors or actuators) it is possible to switch the unit under test between simulated and real peripheries. The failure injection unit (FIU) offers the possibility of simulation of various failures (short circuit of any two signals, line break, short circuit according to GND, etc.). The sockets on the front panel (BOB: Breakout Box) allow manual test runs, for example signal failure, connecting external measuring or real components. In normal mode, the respective connector pairs are short-circuited. Using the carrier board, you can remeasure signals sequentially with an internal high-precision measuring device before they are forwarded to the unit under test. This enables automated special measurements and/or self tests.
- Real-time controllable
- High-precision signal conditioning (with built-in modules)
- Switch between real components and external loads
- Failure injection unit (FIU)
- Breakout Box (BOB) on the front panel
- High flexibility thanks to modular architecture
- Signal conditioning
- Signal remeasurements
- Failure injection in HIL test systems